1. ESD :
Author: Steven H. Voldman
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Electric discharges,Electrostatics,Integrated circuits-- Protection,Integrated circuits-- Reliability,Integrated circuits-- Testing,Semiconductors-- Failures
Classification :
TK7871
.
852
.
V65
2009
2. Failure analysis of integrated circuits :tools and techniques
Author: edited by Lawrence C. Wagner
Library: Library of Razi Metallurgical Research Center (Tehran)
Subject: Failures ، Semiconductors,Testing ، Integrated circuits,Reliability ، Integrated circuits
Classification :
TK
7871
.
852
.
F35
1999
3. Failure analysis of integrated circuits : tools and techniques
Author: edited by Lawrence C. Wagner
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Semiconductors - Failures , Integrated circuits - Testing , Integrated circuits - Reliability
Classification :
TK
7871
.
852
.
F35
1999
4. Wafer-level testing and test during burn-in for integrated circuits /
Author: Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
Library: Center and Library of Islamic Studies in European Languages (Qom)
Subject: Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,Integrated circuits-- Testing.,Integrated circuits-- Wafer-scale integration.,Semiconductors-- Testing.,TECHNOLOGY & ENGINEERING-- Electronics-- Digital.,TECHNOLOGY & ENGINEERING-- Electronics-- Microelectronics.
Classification :
TK7874
.
B35
2010
5. Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
Author: Bahukudumbi, Sudarshan.
Library: Library and Information Center of Ayatollah Imani of Salman Farsi University (Fars)
Subject: Integrated circuits, Testing,Integrated circuits, Wafer-scale integration,Semiconductors, Testing
Classification :
TK
7874
.
B22W3
2010
